Have confidence in your supply chain with our random sample and testing services. We have extensive knowledge in statistical methodology that we'll use to validate your materials.
With SEM imagery, we can identify failure modes such as corrosion and rust through technical and scientific processes.
We have extensive test equipment available to reverse engineer standard circuits, application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs) and provide actionable information for your organization.
We can identify unknown semiconductor chips, instruction set architectures (ISAs), and more through a complete layer-by-layer image of the chip.
The owner, Justin Tullos, is a service-connected disabled veteran of both Iraq and Afghanistan campaigns (OIR, OFS). He has his Master of Science in Electrical Engineering and an IEEE Journal Publication that he authored.